Perform full hot-swap and physical layer fault injection with E1.S EDSFF drives.

Provides full hot-swap automation for GEN4 PCIe drives using the latest EDSFF specification. This module works with any E1.L EDSFF-compatible device.

The module has full control over power, data and sideband pins, allowing simulation of any possible hot-swap scenario. Individual control of each signal, pin bounce and high speed glitching combine to greatly increase the number of test cases you can perform. ‘Driving’ is available on some sideband pins, allowing a range of additional tests to drive signals high/low rather than just disconnecting them. The ‘Triggering’ version has additional MCX trigger IN/OUT to sync with external test equipment.

Drive modules can be used individually for simple bench testing, or multiple units can be used to automate an entire storage enclosure.

Each drive module requires one port on a Torridon Controller.

 

QTL2334

This is the basic module.

QTL2351

This version includes external triggering IN/OUT via SMA cables to allow connection to an external analyzer or similar.